High-resolution transmission electron microscopy studies of structural modifications in Pd-Al₂O₃ interfacesMUSCHIK, T; RÜHLE, M.Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties. 1992, Vol 65, Num 2, pp 363-388, issn 0141-8610Article

Electroluminescence in a-Si1-xCx: H p-i-n structuresPEVTSOV, A. B; ZHERZDEV, A. V; FEOKTISTOV, N. A et al.International journal of electronics. 1995, Vol 78, Num 2, pp 289-295, issn 0020-7217Conference Paper

Temperature dependence of radiative and non-radiative lifetimes in hydrogenated amorphous siliconMUSCHIK, T; SCHWARZ, R.Journal of non-crystalline solids. 1993, Vol 164-66, pp 619-622, issn 0022-3093, 1Conference Paper

Compositional dependence of photoluminescence spectra in hydrogenated amorphous silicon-sulfur alloysMUSCHIK, T; SCHWARZ, R; HAMMAM, M et al.Journal of luminescence. 1991, Vol 48-49, pp 641-644, issn 0022-2313, 4 p., p.2Conference Paper

The relation between the visible and the infrared luminescence bands in porous silicon. Comparison with amorphous Si alloysPETROVA-KOCH, V; MUSCHIK, T.Thin solid films. 1995, Vol 255, Num 1-2, pp 246-249, issn 0040-6090Conference Paper

Electron spin resonance investigations of oxidized porous siliconMEYER, B. K; PETROVA-KOCH, V; MUSCHIK, T et al.Applied physics letters. 1993, Vol 63, Num 14, pp 1930-1932, issn 0003-6951Article

Characterization of band tail states in amorphous silicon alloys by temperature dependent photoluminescenceMUSCHIK, T; SCHWARZ, R; KARG, F et al.Journal of luminescence. 1991, Vol 48-49, pp 636-640, issn 0022-2313, 5 p., p.2Conference Paper

A novel technique to study grain boundary and surface segregation under identical conditions with AES = Nouvelle technique d'étude de la ségrégation aux joints de grains et en surface sous des conditions identiques avec spectrométrie AugerMUSCHIK, T; HOFMANN, S; GUST, W et al.Scripta metallurgica. 1988, Vol 22, Num 3, pp 349-354, issn 0036-9748Article

Energetic and kinetic aspects of the faceting transformation of a Σ3 grain boundary in CuMUSCHIK, T; LAUB, W; WOLF, U et al.Acta metallurgica et materialia. 1993, Vol 41, Num 7, pp 2163-2171, issn 0956-7151Article

Diffusion induced grain boundary migration of symmetric and asymmetric <011> {011} tilt boundaries during the diffusion of Zn into CuSCHMELZLE, R; GIAKUPIAN, B; MUSCHIK, T et al.Acta metallurgica et materialia. 1992, Vol 40, Num 5, pp 997-1007, issn 0956-7151Article

Rapid-thermal oxidized porous Si-The superior photoluminescent SiPETROVA-KOCH, V; MUSCHIK, T; KUX, A et al.Applied physics letters. 1992, Vol 61, Num 8, pp 943-945, issn 0003-6951Article

The influence of grain boundary inclination on the structure and energy of Σ=3 grain boundaries in copperWOLF, U; ERNST, F; MUSCHIK, T et al.Philosophical magazine. A. Physics of condensed matter. Defects and mechanical properties. 1992, Vol 66, Num 6, pp 991-1016, issn 0141-8610Article

Interfaces effectives et pentes d'Urbach de multicouches a-Si:H/a-SiN_x:HBEAUDOIN, M; MEUNIER, M; MUSCHIK, T et al.Canadian journal of physics (Print). 1992, Vol 70, Num 10-11, pp 824-829, issn 0008-4204Conference Paper